1. Kelvin probe force microscopy :
پدیدآورنده : Sascha Sadewasser, Thilo Glatzel, editors.
کتابخانه: Center and Library of Islamic Studies in European Languages (Qom)
موضوع : Atomic force microscopy.,Electrostatics-- Measurement.,Scanning probe microscopy.,Materials science.,Materials science.,Measurement.,Mensuration & systems of measurement.,Microscopy.,Nanotechnology.,Physical measurements.,Physics.,Precision instruments manufacture.,SCIENCE-- General.,Spectrum analysis, spectrochemistry, mass spectrometry.,Spectrum analysis.,Surfaces (Technology),Testing of materials.,Thin films.
رده :
QH212
.
A78
K45
2018
2. Techniques of instrumentation
پدیدآورنده : / A. C. Srivastava,Srivastava
کتابخانه: Central Library and Documents Center of Tehran University (Tehran)
موضوع : Mensuration -- Technique,Measuring instruments
رده :
QA
465
.
S65
1984
